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New Testing Technology Removes Barrier to Exploiting Improved Smart Weapon Capabilities

| AF SBIR/STTR | Sept. 5, 2017

Chip Design Systems LLC

  • LOCATION: Hockessin, Delaware
  • TOPIC NUMBER: AF131-098
  • TOPIC TITLE: Night Glow Short Wave Infrared LED Image Projector Development (NSLEDS)
  • TECHNICAL PROJECT OFFICE: AFRL Munitions Directorate
    Eglin AFB, FL

The next generation of smart weapons is a step closer to the warfighters’ arsenal because of a partnership between a Delaware-based small business and the Air Force Research Laboratory.

With support from the Air Force Small Business Innovation Research/Small Business Technology Transfer Program, Chip Design Systems LLC and its team of experts worked with AFRL’s Munitions Directorate to bridge the gap between newer smart weapon sensors and the ability to fully exploit those improved capabilities.

Smart weapons with Infrared imaging sensors are known for their accuracy and can provide big tactical advantages, but the path to their deployment requires extensive validation testing on the ground.

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